Forensic Analysis of Organic and Inorganic Compounds Associated with Microelectronics

NSWC Crane is interested in the research and development of advanced microelectronics screening techniques for counterfeit detection. In particular, research using mass spectrometry for forensic analyses of organic and inorganic compounds associated with microelectronic, especially the compounds and materials associated with Plastic-Encapsulated Microelectronics (PEM's).