Description
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE*** The National Institute of Standards and Technology (NIST) Chemical Process and Nuclear Measurements Group is seeking a research-grade Fourier Transform Infrared (FT-IR) Spectrometer. The Group is involved in a CHIPS R&D Metrology project to characterize the stability of biofunctional semiconductor interfaces in chip-based biosensors with a focus on improving manufacturability. As a part of this program, NIST aims to develop operando methods for biointerface characterization using optical, electrical, and electrochemical measurements on surfaces functionalized with self-assembled monolayers (SAMs) and bioreceptors. The Chemical Process and Nuclear Measurements Group in the Chemical Science Division has specialized expertise in developing in situ and operando infrared measurements on various chemical systems. In support of this work, the group requires a research-grade Fourier Transform Infrared (FT-IR) Spectrometer. The CHIPS Metrology program develops and advances cutting edge metrology capabilities for members of the US semiconductor manufacturing ecosystem. This NIST conducted research program works with device manufacturers, tool vendors, materials suppliers, and other organizations to address critical metrology gaps to spur innovation within seven grand challenge areas. For more information on CHIPS Metrology, please visit https://www.nist.gov/chips/research-development-programs/metrology-program. The Chemical Process and Nuclear Measurements Group is seeking a research-grade Fourier Transform Infrared (FT-IR) Spectrometer, which will be used to measure the stability and failure mechanisms of chip-based biosensors. The measurements are a critical component of a CHIPS R&D Metrology program to develop a relationship between functionalization, performance, and lifetime of biosensors built using semiconductor technology. Understanding the specific mechanisms of interface fabrication and degradation will accelerating biosensor development and improve manufacturing processes critical for commercial viability. NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements: Line Item 0001: FT-IR Spectrometer Description: Infrared spectrometer configured with KBr beamsplitter and windows, DLaTGS detector, fast scan option, external detector positions, trigger electronics, time-resolved measurement capability, and data processing software Quantity: 1 Technical Specifications for Hardware Spectral range: 8,000 cm-1 to 350 cm-1 Spectral range extension: Field-upgradable to 15 cm-1 to 28,000 cm-1 Spectral resolution: 0.16 cm-1 or better Wavenumber accuracy: 0.005 cm-1 or better at 1,554 cm-1 Photometric accuracy: 0.1% transmission or better Signal-to-noise ratio: 10,000:1 or better at 2,000 cm-1, 4 cm-1 resolution, 5 s acquisition time (sample and reference channels) Interferometer type: Permanently aligned interferometer with no adjustments for maximal long-term stability Interferometer speed: 2 kHz to 160 kHz, or faster Laser: Stabilized HeNe Scan type: Rapid scan (continuous scan) Spectral acquisition rate: 70 spectra/s or greater at 16 cm-1 resolution Analog-to-digital converter (ADC): Dual-channel, 24-bit On-detector pre-amp and ADC Optics bench purging: Built-in desiccant cartridges Dry air or nitrogen purging from external supply Light source: Stabilized, air-cooled, globar Beamsplitter: Broadband KBr, 10,000 cm-1 to 400 cm-1 Detector: Temperature-controlled DTGS installed in internal compartment Additional internal detector position for one MCT or InSb detector Software-controlled motorized beam steering to each detector position Beam outlet ports: Two outlets First outlet on the right side of the spectrometer bench Second outlet on the left side of the spectrometer bench Software-controlled motorized beam steering for each output Windows: Sample compartment: KBr Beam outlets (2): KBr Aperture wheel (J-stop): 250 um to 8 mm in diameter, at least 10 positions Filter wheel: Compatible with 25 mm filters, at least 8 position Installed filters: NG-4 glass, NG-9 glass, NG-11 glass, polystyrene External input-output: At least 4 digital I/O channels to send or receive TTL signals Hardware interface: BNC connectors External detector interface: At least 2 external detector channels Compatibility with Bruker optics and accessory plates: Compatible with Bruker beamsplitters from Invenio R Compatible with Bruker sources from Invenio R Compatible with Bruker detectors from Vertex 70 and Invenio R Compatible with Bruker QuickLock baseplates for accessories Communications interface: Ethernet Technical Specifications for Software Scope: Single software package for data acquisition, automation, and analysis Operating system compatibility: Windows 11 64-bit Installation: User-installable on government owned PC Data acquisition: Time-resolved rapid-scan mode with double-sided forward/backward interferogram processing (split interferograms) Repetitive rapid-scan measurements initiated by external TTL signals Sequence-based data acquisition, including nested loops for spectral co-adding over multiple iterated acquisitions Control over digital IO lines during a sequence Ability to add arbitrary time delays to a sequence Ability to wait for multiple trigger signals at different points during a sequence Data storage: Single data file for storing single channel, interferogram, and absorbance/transmittance data with traceable log of all data transformations for both single spectra and time-series spectra Data processing: Ability to set FT parameters such as phase resolution, phase correction, apodization, and zero filling Ability to reprocess single channel data Ability to perform arbitrary spectral calculations such as addition, subtraction, averaging, and ratioing Ability to perform peak fitting and integration with adjustable peak models and background subtraction Data visualization: 2D and 3D plotting of single spectra and time-series spectra Arbitrary scaling and manipulation of plotted spectra Stacked, tiled, and cascaded display of multiple single spectra Contour and surface plots of time-series spectra Time-resolved data processing: Ability to co-add and extract spectra from rapid-scan data Ability to reprocess rapid-scan interferograms using arbitrary reference spectra as background Data export: Batch exporting of multiple data files to human-readable text format such as CSV Instrument control: Graphical representation of beam path in spectrometer bench with software-controlled mirrors for path selection Optical component recognition: Automated recognition and configuration of installed optical components (sources, beamsplitter, detectors, accessories) Saved instrument configuration: Ability to save and recall the complete hardware configuration and acquisition parameters used for a given measurement using a single file Ability to save and recall rapid-scan automated sequences using a single file Programming interfaces: LabVIEW-compatible programming interface to execute measurements, acquire spectra, and read data files for post-processing Python programming interface to execute measurements, acquire spectra, and read data files for post-processing; ability to execute Python code in the FT-IR software Line Item 0002: InSb Detector Description: Cryogenic InSb detector Quantity: 1 Technical Specifications Liquid-nitrogen cooled InSb detector 10,000 to 1,850 cm-1 spectral range D* = 1.5x1011 cmHz1/2/W or better On-detector pre-amplifier and 24-bit ADC Mountable inside spectrometer bench Interface cable for connecting externally mounted detector to spectrometer bench External mounting hardware, such as dovetail guide to mount detector to custom optical apparatus Line Item 0003: MCT Detector Description: Cryogenic MCT detector Quantity: 1 Technical Specifications Liquid-nitrogen cooled MCT detector 12,000 to 600 cm-1 spectral range D* = 2x1010 cmHz1/2/W or better On-detector pre-amplifier and 24-bit ADC Mountable inside spectrometer bench Interface cable for connecting externally mounted detector to spectrometer bench External mounting hardware, such as dovetail guide to mount detector to custom optical apparatus Line Item 0004: Wafer ATR Accessory Description: Prism coupled wafer ATR accessory Quantity: 1 Technical Specifications For attenuated total reflection (ATR) analysis of impurities in silicon wafers Silicon prism based unit for non-destructive mechanical coupling to wafers 40 mm spacing between points coupling the wafer to the prism Silicon wafer samples act as internal reflection elements Sufficiently larger number of reflections for analysis of organic monolayers Mountable inside purged spectrometer bench Compatible with Bruker QuickLock baseplates NIST conducted market research from November 2025 through November 2025 by speaking with colleagues, performing internet searches, and speaking with vendors to determine what sources could meet NIST’s minimum requirements. The results of that market research revealed that only Bruker Scientific LLC (UEI: MG2JF771VWU5 ) appears to be capable of meeting NIST’s requirements. HOW TO RESPOND TO THIS NOTICE In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response. Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact listed at the bottom of this notice as soon as possible, and preferably before the closing date and time of this notice. Provide the complete name of your company, address, name of contact for follow-up questions, their email, their phone number and, if your company has an active registration in https://sam.gov, your company’s Unique Entity ID (UEI). Details about what your company is capable of providing that meets or exceeds NIST’s minimum requirements. Whether your company is an authorized reseller of the product or service being cited and evidence of such authorization. Identify any aspects of the description of the requirements in the BACKGROUND section above that could be viewed as unduly restrictive or create unnecessary barriers that adversely affect your firm’s ability to fully participate in a procurement for such services and explain why. Please offer suggestions for how the requirements could be organized or structured to encourage the participation of small businesses. For the NAICS code Indicate whether your company is (a) a small business or (b) other than small business. See the Table of Small Business Size Standards and the associated .pdf download file for small business size standards and additional information. If you believe the NAICS code listed in this notice is not the best NAICS code for the type of product addressed in this notice, identify an alternative NAICS code that you believe would be more appropriate for the planned procurement. If your firm has existing Federal Supply Schedule contract(s) or other contracts for products or services against which the Department may be able to place orders, identify the contract number(s) and other relevant information. Describe your firm’s experience (as a prime, subcontractor, or consultant) providing the products or services described in Background section. Provide any other information that you believe would be valuable for the Government to know as part of its market research for this requirement. Please let us know if you would like to engage to get a better understanding of the requirement or need additional information about the Government’s requirement for the products or services described in the Background section. QUESTIONS REGARDING THIS NOTICE Questions regarding this notice may be submitted via email to the Primary Point of Contact and the Secondary Point of Contact listed in this notice. Questions should be submitted so that they are received with 5 days of this posting. Questions will be anonymized and answered via sources sought notice amendment following the question submission deadline. IMPORTANT NOTES The information received in response to this notice will be reviewed and considered so that the NIST may appropriately solicit for its requirements in the near future. This notice should not be construed as a commitment by the NIST to issue a solicitation or ultimately award a contract. This notice is not a request for a quotation. Responses will not be considered as proposals or quotations. No award will be made as a result of this notice. NIST is not responsible for any costs incurred by the respondents to this notice. NIST reserves the right to use information provided by respondents for any purpose deemed necessary and appropriate. ThaNk you for taking the time to submit a response to this request!