SLAC National Accelerator Laboratory is operated by Stanford University for the Department of Energy. As a management and operating contractor, subcontracts awarded by the Laboratory are not Federal procurements, and are not directly subject to the Federal Acquisition Regulations in 48 CFR. Nonetheless, certain Federal laws, Executive Orders, and regulations may affect our DOE approved purchasing system, as required by statute, regulation, or contract terms and conditions. Required item(s) listed below: Tip Scanner Atomic Force Microscope = Qty 1 Technical evaluation criteria as follows: All specs must be met at the customers site in an ISO 6 cleanroom environment All parts of the tool must be demonstrated to be ISO 6 or better cleanroom compatible Tool must allow imaging of: Wafers of 25 mm to 200 mm. Variable shape/size pieces; Some pieces may be 25 mm thick. Soft materials such as photoresists, polymers, and biomaterials The center 150 mm region of a 300 mm X 100 mm X 25.4 mm thick x-ray mirror. Glass EUV optics pieces, 15 mm thick with sawtooth gratings. True Tip Scanner in which the tip is actuated in all axes, XY and Z, for the scanning motion. The stage and sample remain stationary during scanning. Instrument must meet or have lower than 35 pm noise under VC-D conditions Must be able to produce atomic resolution images from materials like mica or graphene. Tool must have a low frequency (~2kHz), off resonance, low magnitude force (~ 10 pN) tapping mode. The low force setpoint is achieved at minimum distance shorter than the minimum in force (attractive force is negative) in the force curve where the sum of attractive and repulsive forces produce a low magnitude force (~10 nN), and little or no damage to sample. In the off resonance tapping mode the tip approach, setermination of imaging force, and scanning setup must be fully automated. All scan parameters (speed, feedback setting, feedback gains, etc.) are set by an automated built-in optimization routine. In low force off resonance tapping, high resolution images may be produced for the smallest force setpoints selectable with effective line rates of at least 2 Hz at 512 pixels per line. The off resonance low force setpoint tapping mode must be capable of operation without limiting functionality with fluid cells, heating cells and electrochemical cells. Tip approach to sample must be fully automated for all modes. Scanner must scan at least 90 um X 90 um XY All of the following modes must be standard: Contact mode Lateral Force Microscopy (LFM) Torsional Resonance Mode Force Spectroscopy Force Volume Mapping (with linear ramps) Off resonance tapping mode down to 2kHz Tapping mode with Phase Imaging Electric Force Microscopy (EFM)Kelvin Probe Force Microscopy (KPFM) in single pass and dual pass Piezoresponse Force Microscopy (PFM) MFM Stage must have a 200 mm (or larger) vacuum chuck. Stage must be motorized with at least 150 X 150 mm travel. Stage must be fully computer controlled with operator selecting locations with joystick or mouse, while a live optical image of sample is displayed on the computer monitor. AFM must include top-view optics with motorized focus & digital zoom The Optics Field-Of-View must be software controlled and cover the range from over 1400 μm down to less than 200 μm, without opening the hood and have resolution of 1.6 um or better. The optics must include a 5-Megapixel camera, and software to display and store the optical image from within the AFM software System must include an acoustic enclosure that is ISO 6 cleanroom compatible. Tool must include a vibration isolation/cancellation table. Must allow data acquisition and storage in a multidimensional format such as Datacube, which is fully integrated with the AFM software. Tool operation software must be demonstrated to be user friendly, where materials scientists, chemists and physicists without AFM specialization can readily acquire images. Tool must allow future optional modes for electrochemistry, biology, and further electrical measurements without changing scanner or stage. Tool must be a model already on the market and demonstrated. Quote is for product only; no on-site services permitted. Source selection will be based on Lowest Priced Technically Acceptable method. Please provide a price and lead time quotation by COB June 21, 2024. Send quote to
[email protected] . Please be advised that the requirement was also posted in SAM.gov. Is there any room for additional discount such as for Academic, ICPT, GSA, or Government Institutions? Buy American Act Certification (BAA) applies to awards over $10,000. Representations & Certifications Rider is required. Once completed the Reps and Certs is valid for one year until renewal. If you have already completed one within the year please disregard. Otherwise, please complete and return. All subcontractors are required to register in the System for Award Management (www.sam.gov). If possible, please provide a link to your webpage for published price list to substantiate for the prices quoted. The resulting purchase order will be issued on a fixed price basis. SLAC National Accelerator Laboratory Terms and Conditions for Fixed Price Commercial Supplies and Services (Rev. August 2023) will be made a part of the resulting order. Please mark up terms and conditions if you wish to negotiate. No mark ups mean that you accept SLAC Terms and Conditions. Payment Terms will be NET-30 Freight terms will be FOB Destination Prepaid and Add You are requested to mark and identify proprietary/confidential information provided in response to the solicitation. Contact me directly with any questions. Sincerely, Katherine Jill A. Coh Procurement Commodities Team Lead SLAC National Accelerator Laboratory 2575 Sand Hill Road Menlo Park, CA 94025 Phone: 650-926-2770 Email:
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