The U.S. Department of Commerce, National Institute of Standards and Technology (NIST) together with the Department of Homeland Security, Science and Technology Directorate, will sponsor a workshop to be held at the NIST campus, Gaithersburg, Maryland, on April 5 & 6, 2006. This workshop will address important topics in automated searches of latent fingerprints. The primary focus will be on standardizing methodology for testing vendor latent search systems. The goal is to provide a methodology which is fair, protects vendor proprietary code and algorithms, while at the same time respecting privacy issues. In addition to testing, other important topics such as “new generation” features, and latent image quality measures will be discussed. Representatives from Government, law enforcement, industry vendors, and academia are invited. Additional workshop and registration information is available online at http://www.itl.nist.gov/iad/894.03/latent , or you may contact Vladimir Dvornychenko at
[email protected].