Subject: Soliciting help to design a common interface map for A Automatic Test Systems Description: The Department of Defense Next Generation Automatic Test Systems (NxTest) Integrated Product Team (IPT) is soliciting help to design a common interface map to be used by both government and industry Automatic Test System. The map will be designed to show the location of instrumentation output and input. The interface map will serve as a layout for future automatic test system interface design. The interface map will be design by both the government and industry. The interface map will be design to embrace legacy/backward compatible support, common pins, future growth potential/density increase, and consideration for all frequency requirements. This meeting will be held in Natick, MA. at: Courtyard Boston Natick August 20 For Reservations call: 1-508-655-6100 For further information contact: Mark Hanchey Phone 301-872-0291
[email protected] (OR) Wallace M Daniel Phone 229-639-7694
[email protected] Do not contact Ms. Chartier for information, contact one of the above.