X-Ray Nano-Computed Tomography (CT) Unit

Sources Sought for X-Ray Nano-Computed Tomography (CT) unit with 50 nm resolution or greater NREL is currently seeking sources that are capable of providing a X-Ray Nano-Computed Tomography (CT) unit with 50 nm resolution or greater. This document invites responses from all sources globally in expressing their interest and capabilities. Organizations responding to this Sources Sought Notice must demonstrate specific technical capabilities and experience. NREL reserves the right to include additional requirements for qualification in any resultant official Request for Proposal (RFP). It is NREL’s intent the X-Ray Nano-CT will conduct X-ray nano-CT on energy materials and achieve 50 nm resolution in reconstructed tomograms; conduct combined phase and absorption contrast imaging that facilitates good contrast between high density and low density materials in close proximity to each other; facilitate a stream-lined user process of sample preparation, data processing, and microstructural quantification.