J -- ANNUAL MAINTENANCE AGREEMENT FOR ELECTRON MICROSCOPE

The U. S. Department of Commerce, National Institute of Standards and Technology (NIST) proposes to negotiate on a sole source basis, under the authority of 41 U.S.C. 253(c)(1), with FEI Company for a preventative maintenance service contract for the SIRION400 Scanning Microscope.This procurement is being conducted per FAR Part 13, Simplified Acquisition Procedures (NTE $100K). The period of performance is for one year with an additional option year possible. FEI is the only vendor who is factory authorized to provide this service. This synopsis is issued for information only. No competitive solicitation is planned. Information submitted in response to this notice will be used solely to determine whether or not use of competitive procedures to fulfill this requirement would be in the Government's best interest and must address qualifications pertinent to this requirement. Any questions regarding this notice must be submitted in writing to the attention of Ms. Rima (e-mail preferred) by the close of business on April 25, 2007. Anticipated award date is April 26, 2007.